Real Time X-ray
RTX is a high-resolution 20-180 kV microfocus X-ray inspection system for real-time inspection of electronic components, solder joints and metallurgical samples.
RTX uses high-energy X-rays to look through samples and shows a density map of the device. Click here to view samples of these images. It is very useful for examining components not visible on the exterior of the sample:, such as bond wires, die size, solder connections and other components.
Ideal Uses of RTX
- Non-destructive way to detect defects within a sealed device
- Screening of production electronic components to military standards
- Outstanding application for failure analysis investigations
- Client witnessed live radiographic inspection
Strengths
- Non-destructive inspection technique
- 180 degree table rotation
- 70 degree Detector tilt capability
Limitations
- Large sample size
- Cannot resolve very thin separations, delaminations or micro cracks
- Not good for very light materials
RTX Technical Specifications
- Resolution of 0.2 microns; beam voltage from 10-180 kV
- Three-inch sample size capability in a single image. Larger samples require multiple images, with maximum sample size ~22 inches square and larger with limited viewing areas.